Berlin 2012 –
wissenschaftliches Programm
MM 50: Topical Session Modern Atom Probe Tomography IV - Thin Films and Structural Materials
Donnerstag, 29. März 2012, 11:45–13:00, H 0107
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11:45 |
MM 50.1 |
Interface sharpening in miscible Ni/Cu multilayers studied by atom probe tomography — •Zoltán Balogh, Mohammed Reda Chellali, Gerd-Hendrik Greiwe, and Guido Schmitz
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12:00 |
MM 50.2 |
Phase Separation in Immiscible Copper-Tantalum Alloy Films — •Claudia M. Mueller, Stephan S.A. Gerstl, Alla S. Sologubenko, and Ralph Spolenak
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12:15 |
MM 50.3 |
Spinodal decomposition in TiAlN/CrN multilayer hardcoatings studied by atom probe tomography — •Ivan Povstugar, Pyuck-Pa Choi, Jae-Pyoung Ahn, and Dierk Raabe
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12:30 |
MM 50.4 |
Atom-Probe Tomography of Grain Boundary Oxides in Stressed and Cold-Worked 304 Stainless Steel — •Karen Kruska, David W Saxey, George D W Smith, Takumi Terachi, Takuyo Yamada, and Sergio Lozano-Perez
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12:45 |
MM 50.5 |
The influence of Cu on the microstructure of AlCoCrFeNi high entropy alloys — •Anna Manzoni, Nelia Wanderka, Sheela Singh, Haneen Daoud, Rainer Völkl, Uwe Glatzel, B.S. Murty, and John Banhart
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