Berlin 2012 – scientific programme
Parts | Days | Selection | Search | Updates | Downloads | Help
O: Fachverband Oberflächenphysik
O 13: Polymeric biomolecular films
O 13.2: Talk
Monday, March 26, 2012, 16:15–16:30, MA 005
Core-energy level energy difference between the surface and bulk regions of organic semiconductor films — •Hiroyuki Yoshida1,2, Eisuke Ito3, Masahiko Hara3, Naoki Sato1, Thomas Ules4, and Michel G. Ramsey4 — 1Institute for Chemical Research, Kyoto University, Uji, Kyoto 611-0011 JAPAN — 2PRESTO, Japan Science and Technology Agency (JST), 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan — 3Flucto-Order Functions Research Team, RIKEN-HYU Collaboration Research Center, RIKEN Advanced Science Institute, 2-1 Wako, Hirosawa, Saitama 351-0198, Japan — 4Institute of Physics,Karl-Franzens University Graz, A-8010 Austria
There has been an argument whether the energy level determined by PES is difference between the surface and bulk regions for decades. The reason was that no appropriate experimental method has been available to distinguish the energy levels between the surface and bulk of materials.
We have recently developed a novel analytical method of the core level energies with depth resolution; X-ray photoemission spectra (XPS) are measured at multiple detection angles and the energy profiles are precisely analyzed using target factor analysis.
By applying this method to organic semiconductor thin films, we found that the core-levels of the first surface layer are different from those of the bulk by about 0.3 eV. The origin is also discussed from the systematical study on different organic materials.