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O: Fachverband Oberflächenphysik

O 16: Scanning probe methods II

O 16.6: Vortrag

Montag, 26. März 2012, 17:15–17:30, MA 043

Probing defects with the Phantom Force — •Alfred Weymouth, Thorsten Wutscher, and Franz Giessibl — Universität Regensburg, Regensburg, Germany.

Simultaneous force and tunneling microscopy (AFM and STM, respectively) offer complementary information that can be used to probe local phenomena. Typically, this is done by assuming the two channels represent independently the electronic and atomic structure (e.g. [1]). We have recently demonstrated that it is possible to dominate AFM data by locally altering the attractive electrostatic force between tip and sample via the tunneling current and sample resistivity [2]. While the AFM data can no longer be assumed to be decoupled from the STM data, this opens the possibility of using simultaneous AFM and STM data to probe local surface conductivity. Here we demonstrate that we can probe conductance changes over a defect on the H-terminated Si(100) surface.

[1] G.H. Enevoldsen et al., Phys. Rev. Lett., 102, 136103 (2009).

[2] A.J. Weymouth et al., Phys. Rev. Lett., 106, 226801 (2011).