O 16: Scanning probe methods II
Montag, 26. März 2012, 16:00–18:30, MA 043
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16:00 |
O 16.1 |
ncAFM Force Spectroscopy of Long Range Tip Sample Interaction using FIM Characterized Tip — •Jens Falter, Daniel-Alexander Braun, Gernot Langewisch, Hendrik Hölscher, Harald Fuchs, and André Schirmeisen
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16:15 |
O 16.2 |
Development of a Diamond-based Scanning Probe Spin Sensor with sub-nm Spatial Resolution — •Eike Oliver Schäfer-Nolte, Friedemann Reinhard, Markus Ternes, Jörg Wrachtrup, and Klaus Kern
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16:30 |
O 16.3 |
Magnetoresistive Tunnelling Structures with Magnetostrictive Electrodes as Sensors for Atomic Force Microscopy — •Tobias Meier, Ali Tavassolizadeh, Dirk Meyners, and Hendrik Hölscher
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16:45 |
O 16.4 |
Revealing the angular symmetry of chemical bonds by atomic force microscopy — •Joachim Welker and Franz J. Giessibl
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17:00 |
O 16.5 |
Molecular ordering and local work function of pentacene on ioniccrystalline surfaces — •Julia Neff, Jan Götzen, Peter Milde, and Regina Hoffmann-Vogel
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17:15 |
O 16.6 |
Probing defects with the Phantom Force — •Alfred Weymouth, Thorsten Wutscher, and Franz Giessibl
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17:30 |
O 16.7 |
Superlubric sliding of metallic nanoparticles: The influence of contact area and crystallinity — •Dirk Dietzel, Tristan Mönninghoff, Michael Feldmann, Udo D. Schwarz, and Andre Schirmeisen
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17:45 |
O 16.8 |
Hidden Atomic Resolution - Investigation of a Complex Oxide Material with 2D Force Spectroscopy — •Christin Büchner, Leonid Lichtenstein, Stefanie Stuckenholz, Markus Heyde, and Hans-Joachim Freund
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18:00 |
O 16.9 |
A pick-and-place technique for the assembly of integrated quantum optical hybrid devices — •Andreas W. Schell, Günter Kewes, Janik Wolters, Tim Schröder, Thomas Aichele, and Oliver Benson
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18:15 |
O 16.10 |
Scanning Microwave Microscopy Mapping of Semiconducting and Dielectric Components in CMOS Logic devices — •Matthias A. Fenner, Thomas Schweinböck, and Jesper Witteborn
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