Berlin 2012 – scientific programme
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O: Fachverband Oberflächenphysik
O 34: Poster Session I (Graphene; Plasmonics and nanooptics; Coherence and coherent control in nanophotonics and plasmonics)
O 34.25: Poster
Tuesday, March 27, 2012, 18:15–21:45, Poster E
Characterization of functional plasmonic elements: a far-field approach — •Christian Rewitz1, Thomas Keitzl1, Philip Tuchscherer1, Jer-Shing Huang2, Peter Geisler3, Gary Razinskas3, Bert Hecht3,4, and Tobias Brixner1,4 — 1Institut für Physikalische und Theoretische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany — 2Department of Chemistry, National Tsing Hua University, Hsinchu 30013, Taiwan — 3Nano-Optics and Biophotonics Group, Experimentelle Physik 5, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany — 4Röntgen Center for Complex Material Systems (RCCM), Am Hubland, 97074 Würzburg, Germany
Plasmonic modes supported by noble-metal nanostructures offer strong subwavelength confinement and promise the realization of nanometer-scale integrated optical circuits with well-defined functionality. In view of applications in the field of optical communication the dispersion and group velocity of plasmon propagation are of high interest. Here, we present a microscope setup that employs a far-field technique to measure the spectral and spatial transfer functions of plasmonic elements thus enabling us to determine the dispersion and group velocity of plasmon propagation. For the exact determination of the plasmon group velocity, i.e., the speed of ultrashort propagating pulses representing bits of information, a detailed knowledge of the setup transfer function is needed, which we provide here. The setup inherent time delay of signals due to different path lengths is measured with 1 fs accuracy and is used to obtain corrected results for plasmon group velocities.