Berlin 2012 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 35: Poster Session II (Polymeric biomolecular films; Nanostructures; Electronic structure; Spin-orbit interaction; Phase transitions; Surface chemical reactions; Heterogeneous catalysis; Particles and clusters; Surface magnetism; Electron and spin dynamics; Surface dynamics; Methods; Electronic structure theory; Functional molecules)
O 35.110: Poster
Dienstag, 27. März 2012, 18:15–21:45, Poster B
Conductive AFM for CNTs characterisation — •Marius Toader1, Holger Fiedler2, Stefan E. Schulz2,3, and Michael Hietschold1 — 1Chemnitz University of Technology, Institute of Physics, Solid Surfaces Analysis Group, D-09107 Chemnitz, Germany — 2Chemnitz University of Technology, Center for Microtechnologies, D-09126 Chemnitz, Germany — 3Fraunhofer Research Institute for Electronic Nano Systems, D-09126 Chemnitz, Germany
Within a continuous downscaling tendency, the remarkable mechanical and electrical properties of Carbon NanoTubes (CNTs) recommend them as suitable candidates for nanoscale electronics and interconnects. A versatile technique able to address simultaneously morphological and electrical measurements within such nanosystems is Conductive Atomic Force Microscopy (C-AFM). In this work, MWCNTs networks were vertically grown by chemical vapour deposition on a conductive bottom contact line as described in [1]. Using C-AFM, topographic information as well as current mapping of CNTs networks within distinct trenches were obtained. Current-voltage (I-V) characteristics were recorded down to single CNTs bundles. The corresponding reproducibility was checked over multiple measurements sets and distinct locations. Moreover, the sample bias used during the spectroscopy measurements was found to have no influence on the I-V response. The outcome I-V spectra were found to be highly reproducible and consistent with the voltage dependent current mapping of the CNTs networks. [1] Fiedler et al. online via DOI: 10.1109/IITC.2011.5940346