Berlin 2012 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 6: Scanning probe methods I

O 6.2: Vortrag

Montag, 26. März 2012, 10:45–11:00, MA 043

Ultra compact 4-tip STM/AFM for electrical measurements at the nanoscale — •Vasily Cherepanov, Stefan Korte, Marcus Blab, Evgeny Zubkov, Hubertus Junker, Peter Coenen, and Bert Voigtländer — Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany, and JARA-Fundamentals of Future Information Technology

A new type of ultra miniature nano drive was specially developed to serve as an SPM coarse positioning unit. This Koala Drive makes the scanning probe microscopy design ultra compact and leads accordingly to a high mechanical stability. We use the Koala-drive to build a compact 4-tip STM/AFM where four independent scanning units are integrated on a diameter of 50 mm. Here we present the design of the microscope and show several measurement examples to demonstrate the device performance, such as four point measurements on silicide nanowires and graphene samples.