Berlin 2012 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 6: Scanning probe methods I

O 6.5: Vortrag

Montag, 26. März 2012, 11:30–11:45, MA 043

Next generation SPM control system extends the range of applications in surface science — •Alessandro Pioda — SPECS Surface Nano Analysis GmbH

Novel scanning probe microscopy techniques, modes of operation, and advances in microscope hardware are pushing the boundary for signal resolution and flexibility in SPM measurements. Here we present a new state of the art SPM control system, which improves signal precision, resolution, bandwidth and noise performance by about one order of magnitude compared to current generation controllers. The controller incorporates the performance of expensive dedicated instruments in a compact modular multichannel package. In combination with the well proven and flexible Nanonis SPM control software, this next generation controller is the ideal platform for the most demanding microscopy, spectroscopy and transport measurements tasks, opening the door to a larger range of applications compared to current systems. Furthermore, the flexible and easily configurable user interface of the controller and the large number of measurement channels allows its operation as a high performance DC and AC source and measurement interface with ppm precision and multiple lock-in amplifiers, opening new perspectives for materials research.