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10:30 |
O 6.1 |
Combined ion and electron sputtering for STM tip cleaning — •David Hellmann, Ludwig Worbes, Hanna Fedderwitz, Nils Könne, Konstantin Kloppstech, and Achim Kittel
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10:45 |
O 6.2 |
Ultra compact 4-tip STM/AFM for electrical measurements at the nanoscale — •Vasily Cherepanov, Stefan Korte, Marcus Blab, Evgeny Zubkov, Hubertus Junker, Peter Coenen, and Bert Voigtländer
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11:00 |
O 6.3 |
Development of a Scanning Tunneling Microscope for Measurements down to 15 mK — •Maximilian Assig, Fabian Zinser, Markus Etzkorn, Christian R. Ast, and Klaus Kern
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11:15 |
O 6.4 |
Spatial variations of heat transfer at nanoscales investigated by Near-field Scanning Thermal Microscopy (NSThM) — •Ludwig Worbes, David Hellmann, Hanna Fedderwitz, Nils Könne, Konstantin Kloppstech und Achim Kittel
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11:30 |
O 6.5 |
Next generation SPM control system extends the range of applications in surface science — •Alessandro Pioda
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11:45 |
O 6.6 |
Determination of the electron-phonon coupling in ultra-thin Pb films with STM — •Tobias Märkl, Michael Schackert, Martin Hölzer, Sergey Ostanin, Arthur Ernst, and Wulf Wulfhekel
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12:00 |
O 6.7 |
Scanning tunneling microscopy of Ni layers on W(110) — •Johannes Schöneberg, Alexander Weismann, and Richard Berndt
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12:15 |
O 6.8 |
Single Molecule and Single Atom Sensors for Atomic Resolution Imaging of Chemically Complex Surfaces — •Georgy Kichin, Christian Weiss, Christian Wagner, Stefan Tautz, and Ruslan Temirov
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12:30 |
O 6.9 |
Electron transport studies through a single octanethiol molecule — •René Heimbuch, Avijit Kumar, Hairong Wu, Bene Poelsema, and Harold Zandvliet
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12:45 |
O 6.10 |
Atomic Forces and Energy Dissipation of a Bi-Stable Molecular Junction — •Christian Lotze, Martina Corso, Katharina Franke, Felix von Oppen, and Nacho Pascual
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