Berlin 2012 – scientific programme
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O: Fachverband Oberflächenphysik
O 74: Plasmonics and nanooptics IV
O 74.2: Talk
Thursday, March 29, 2012, 16:15–16:30, MA 005
Light trapping in thin-film solar cells characterized by fs-laser pulse backscattering — •Michael Birlo1, Dominik Differt1, Florian Lükermann1, Christian Strüber1, Helmut Stiebig2, and Walter Pfeiffer1 — 1Universität Bielefeld, Universitätsstrasse. 25, 33615 Bielefeld, Germany — 2Malibu GmbH & Co.KG, 33609 Bielefeld, Germany
Multiple light scattering at randomly nanostructured interfaces leads to light trapping and enhances the light absorption and efficiency of thin-film silicon solar cells. To increase the trapping efficiency the scattering mechanism has to be understood and selective characterization tools are needed. In this study we use dual-channel spectral interferometry in order to fully characterize the temporal properties of backscattered radiation from thin-film solar cells illuminated by ultra short laser pulses. The so obtained spectral phase, amplitude and polarization state of the scattered light reveals light localization in the few-micron thick randomly nanostructured thin-film solar cell. In comparison a reference cell with flat interfaces exhibits no light trapping. Spectral interference measurements of broadband coherent radiation represents a suitable tool for light trapping characterization.