Berlin 2012 – wissenschaftliches Programm
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O: Fachverband Oberflächenphysik
O 86: Graphene VI
O 86.3: Vortrag
Freitag, 30. März 2012, 11:00–11:15, MA 041
Micro Four-Point Probe Measurements of Graphene on Silicon Carbide — •Edward Perkins1, Lucas Barreto1, Felix Fromm2, Christian Raidel2, Thomas Seyller2, and Philip Hofmann1 — 1Institut for Fysik og Astronomi, Aarhus Universitet, Ny Munkegade 120, Aarhus 8000C, Denmark — 2Institut für Physik der Kondensierten Materie, Universität Erlangen-Nürnberg, Erwin-Rommel-Strasse 1, D-91058 Erlangen, Germany
Four-point probe measurements are the classic method for investigating conductivity independent of contact resistances. By implementing this technique at the micron scale, in ultra-high vacuum, clean, local measurement of the conductivity is possible. By varying the effective separation of the contact probes, discrimination between conduction through the bulk and the surface can be achieved.
Data from both monolayer graphene on silicon carbide and hydrogen-intercalated quasi-freestanding graphene will be presented. The transport is shown to be two-dimensional in character, and the measured conductivity is combined with photoemission data to extract the mobility.