Berlin 2012 – scientific programme

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O: Fachverband Oberflächenphysik

O 88: Electronic structure II

O 88.6: Talk

Friday, March 30, 2012, 11:45–12:00, MA 043

In situ angle resolved photoelectron spectroscopy (ARPES) during the formation and depth sensitive hard X-ray photoelectronspectroscopy (HAXPES) of a ZnO:Ni nanocomposite — •Arndt Quer, Erik Kröger, Matthias Kalläne, Lutz Kipp, and Kai Rossnagel — Institute of Experimental and Applied Physics, University of Kiel, 24098 Kiel, Germany

Magnetoelectric composits based on piezoelectric and magnetostrictive substances have drawn significant interest in recent years due to their multifunctionality and potential technological aspects, e.g. sensor applications. For the magnetoelectric coupling the interface between the two components and its magnetic and electronic structure is of basic interest. The composite of magnetostrictive Ni thin films on top of pizeoelectric ZnO-substrates was used as a simple basic system. In order to investigate the electronic structure during interface formation, we performed in situ photoelectron spectroscopy (PES), revealing NiO formation at the interface and in addition charge transfer from the Ni adatoms to the ZnO substrate. The resulting enhanced conductivity of the ZnO surface enables high resolution ARPES measurements. These ARPES results of the electronic structure of the composite over the Brillouin zone in ΓMK-plain are shown. Furthermore the "complete" composite of a 5 nm thin film nickel on ZnO substrate was investigated by depth sensitive HAXPES. This work was supported by the DFG via SFB855.