Berlin 2012 – scientific programme

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O: Fachverband Oberflächenphysik

O 91: [MA] Poster II

O 91.21: Poster

Friday, March 30, 2012, 11:00–14:00, Poster A

Temperature and thickness dependent sign change of the Anomalous Hall Effect in Co/Pd multilayers — •Vedat Keskin^1,2, Bekir Aktas², Zoe Kugler¹, Jan-Michael Schmalhorst¹, and Günter Reiss¹ — ¹Thin Films & Physics of Nanostructures, Bielefeld University, Germany — ²Gebze Institute of Technology, Izmit, Turkey

The anomalous Hall effect (AHE) [1] was studied on ultra-thin Co/Pd multilayers, which might be a promising material for AHE based perpendicular magnetic recording technology [2]. The Co/Pd multilayers were grown on Si wafers by using conventional dc magnetron sputtering techniques. We focused on the Co thickness and temperature dependence of the AHE and the longitudinal resistivity, whereas the Pd thickness was kept constant at 1.8nm. The Co thickness was incrementally increased from 0.20nm to 0.55 nm. The AHE measurements were carried out in the temperature range of 14-330 K.Uniquely, we have observed that for a fixed temperature the polarity of the AHE changes at a certain Co thickness, the critical Co thickness decreases with increasing temperature. This behavior will be discussed with respect to the influence of extrinsic skew scattering [3]. [1] E. H. Hall, Philos. Mag. 10, 301 (1880) [2] D. Rosenblatt, M. Karpovski, and A. Gerber, Appl. Phys. Lett. 96, 022512 (2010) [3] J. Smit, Physica (Amsterdam) 24, 39 (1958).