Berlin 2012 – scientific programme

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SYRS: Symposium Resistive Switching

SYRS 2: Poster: Resistive switching (jointly organized by DS, DF, KR, HL)

SYRS 2.45: Poster

Thursday, March 29, 2012, 17:30–19:00, Poster E

Scanning ion irradiation of polyimide films — •Stefan Lücken, Yuri Koval, and Paul Müller — Department of Physics and Interdisciplinary Center for Molecular Materials (ICMM), Universität Erlangen-Nürnberg

Recently we found, that the surface of nearly any polymer can be converted into conductive material by low energy ion irradiation. The graphitized layer consists of nanometer sized graphene and graphite flakes [1]. In order to enhance the conductivity and to increase the size of the flakes we applied a novel method of scanning irradiation [2]. We investigated the influence of various irradiation parameters on the conductivity of the graphitized layer. We show, that the conductance vs. temperature can be described in terms of weak Anderson localization. At approximately 70 K, a crossover occurs from 2-dimensional to 3-dimensional behavior. This can be explained by a decrease of the Thouless length with increasing temperature. The crossover temperature can be used to estimate the thickness of the graphitized layer.

[1] I. Lazareva, Y. Koval, M. Alam, S. Strömsdörfer, P. Müller, Appl. Phys. Lett. 90, 262108 (2007)

[2] S. Lücken Scanning irradiation of polyimide by low-energy Ar ions Diplomarbeit, Erlangen (2011)