Stuttgart 2012 – scientific programme

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A: Fachverband Atomphysik

A 14: Interaction with VUV and X-ray light II

A 14.7: Talk

Tuesday, March 13, 2012, 12:00–12:15, V57.05

X-ray Photon Beam Diagnostics Devices for the Commissioning and User Operation of the Multi-Undulator facility European XFEL — •Jan Grünert, Cigdem Ozkan, Bin Li, Wolfgang Freund, Jens Buck, and Serguei Molodtsov — European XFEL GmbH, Albert-Einstein-Ring 19, 22761 Hamburg, Germany

The X-ray Free-Electron-Lasers (XFELs) LCLS [1], SACLA [2], and the European XFEL [3] open new opportunities in the research of very small structures and at the same time extremely fast phenomena (Ångström and femtosecond resolution). Unlike pulses from a conventional laser radiation is here created by Self-Amplified Spontaneous Emission when electron bunches pass through very long segmented undulators. Shot noise at the origin of this process leads to pulse-to-pulse variations of intensity, spectrum, wavefront, etc. Any XFEL diagnostics is susceptible to single-shot damage due to the extreme brilliance. Apart from the large facility energy range (280eV to 25keV), the particular challenge for the European XFEL diagnostics is the 4.5 MHz intra-bunchtrain repetition rate, causing additional damage by high heatloads and making shot-to-shot diagnostics very demanding [3]. We report on concepts [4,5], developments, and compromises between resolution/accuracy and energy range / shot-to-shot capabilities.

[1] P. Emma et. al.,Nature Photonics, vol. 4, pp. 641 (2010). [2] T. Ishikawa et. al., XFEL/SPring-8 Beamline TDR (2010). [3] M. Altarelli et. al.,The European XFEL TDR (2006). [4] J. Grünert, Proc. FEL09, Liverpool (2009). [5] J. Buck, CDR Photoemission Spectrometer, in prep. [6] C. Ozkan, CDR Imagers, in prep.