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A: Fachverband Atomphysik

A 21: Poster: Precision spectroscopy of atoms and ions

A 21.5: Poster

Dienstag, 13. März 2012, 16:30–19:00, Poster.V

Spectroscopic studies of charge breeding processes in an electron beam ion trap — •Thomas Baumann, José Crespo López-Urrutia, and Joachim Ullrich — Max-Planck-Institut für Kernphysik

A new generation of electron beam ion traps (EBITs) was developed at the Max-Planck-Institute für Kernphysik (MPIK) and recently introduced in facilities like TRIUMF (TITAN EBIT) and the Michigan State University (MSU EBIT) for charge breeding of rare radioactive isotope beams. Future, more powerful devices are under development. To achieve shorter breeding times, design efforts are aiming at the development of electron guns capable of delivering intensities of several amps. For this purpose a new high current EBIT has been built at MPIK.

The charge breeding process within this machine is studied spectroscopically using two grating spectrometers sensitive in the soft x-ray spectral region and a Silicon drift x-ray detector for photon energies above 1 keV. Soft x-ray spectra of highly charged Silicon ions are presented to show the charge state evolution in dependence of the electron beam energy. Furthermore, detailed spectra around the region of strong recombination resonances (KLL, KLM, KLN) in Si ions have been obtained and compared to structure calculations based on the Flexible Atomic Code (FAC). The data shows strong contribution arising from higher order multielectron resonant transitions.