Stuttgart 2012 – scientific programme
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A: Fachverband Atomphysik
A 24: Poster: Interaction with VUV and X-ray light
A 24.14: Poster
Wednesday, March 14, 2012, 16:30–19:00, Poster.V
Few-photon multiple ionization of N2 by 52 eV photons at FLASH — •Moritz Kurka1, Artem Rudenko2, Yuhai Jiang1, Kai-Uwe Kühnel1, Lutz Foucar2, Arne Senftleben1, Kirsten Schnorr1, Georg Schmid1, Oliver Herrwerth3, Matthias Kling3, Stefan Düsterer4, Rolf Treusch4, Claus Dieter Schröter1, Robert Moshammer1, and Joachim Ullrich1,2 — 1Max-Planck Institut für Kernphysik, 69117 Heidelberg — 2Max-Planck Advanced Study Group at CFEL, 22607 Hamburg — 3Max-Planck-Institut für Quantenoptik, 85748 Garching — 4DESY, 22607 Hamburg
We report on the fragmentation of N2 molecules induced by intense (1013 W/cm2) XUV radiation (ℏω = 52 eV) from the Free-Electron Laser in Hamburg (FLASH). Using a dedicated reaction microscope we detect the resulting ions and electrons in coincidence. The combined information contained in the energy and angular distributions of the emerging particles enables us to disentangle the various fragmentation pathways occurring. We will compare our results with those of Jiang et al. which were performed also at FLASH at a photon energy of 44 eV [1].
[1] Y.H. Jiang et al., Phys. Rev. Lett. 102, 123002 (2009).