Dresden 2013 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

T: Fachverband Teilchenphysik

T 65: Halbleiterdetektoren: Forschung und Entwicklung 5

T 65.2: Talk

Thursday, March 7, 2013, 17:00–17:15, GER-007

Test of DEPFET in gated operation — •Felix Müller, Christian Koffmane, Hans-Günther Moser, Jelena Ninkovic, Rainer Richter, Ladislav Andricek, and Andreas Wassatsch — Max-Planck-Institut für Physik, München

DEPFET pixel detectors offer excellent signal to noise ratio, resolution and low power consumption with few material. They will be used at Belle II and are a candidate for an ILC vertex detector.
Due to the rolling shutter read-out they have integration times in the order of several tens of microseconds which can create problems in applications with temporary high background, for instance during the injection of noisy bunches.
In order to overcome this we study a new operation mode which allows a gated or shutter controlled operation of the detector. This makes the detector blind for a certain time interval in which noise is expected whereas the charge of the previous signal will not be removed.
Simulations and successful lab- and beam tests with prototype DEPFET PXD6 matrices will be presented.