Dresden 2013 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

T: Fachverband Teilchenphysik

T 68: Halbleiterdetektoren: Strahlenhärte, neue Materialien und Konzepte 3

T 68.2: Talk

Thursday, March 7, 2013, 17:00–17:15, GER-009

Automatic Detection of Single Event Upsets in the Read Out Chips of the CMS pixel detector — •Luigi Calligaris, Andreas Meyer, and Daniel Pitzl — DESY, Hamburg, Germany

The Pixel detector of the CMS Experiment at CERN's Large Hadron Collider is exposed to an intense flux of ionizing radiation.

The interaction of highly ionizing beam background particles with the chip material can result in so-called Single Event Upsets (SEU) of the Read Out Chips (ROCs) by which the proper operation of the chip is affected. Through detailed monitoring the rates and effects from SEU can be quantified.

In this talk I will show first results using a software setup which is geared towards automatic detection of SEU.