Hannover 2013 – wissenschaftliches Programm
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A: Fachverband Atomphysik
A 22: Poster: Interaction with strong or short laser pulses
A 22.5: Poster
Dienstag, 19. März 2013, 16:00–18:30, Empore Lichthof
Comparison of the carrier-envelope phase dependence of strong-field photoemission from atomic Xenon and a sharp metal tip — Lothar Maisenbacher1, Dominik Hoff2, •Michael Krüger1, Michael Förster1, A. Max Sayler2, Gerhard G. Paulus2, and Peter Hommelhoff1,3 — 1Max-Planck-Institut für Quantenoptik, 85748 Garching bei München — 2Institut für Optik und Quantenelektronik and Helmholtz-Institut Jena, 07743 Jena — 3Universität Erlangen-Nürnberg, 91058 Erlangen
The carrier-envelope phase (CEP) dependence of strong-field photoionization is a powerful tool to understand electron dynamics on ångström and attosecond scales. Recently, photoemission from metal nanotips has also been shown to be highly sensitive to the CEP [1]. The solid-state material response leads to a strongly enhanced near-field that is phase-shifted with respect to the incident field. So far, it was possible to assign the CEP only by comparison to theory. Here we present a direct comparison of the CEP dependence of photoemission from atomic Xenon and a metal nanotip employing a phase-tagging scheme [2]. We are able to characterize the full dielectric response of different nanotips for the first time, which is of high interest in the emerging field of nano-optics. Moreover, the nanotip represents an ideal electric field sensor due to its size. By scanning through the focal spot of a Gaussian beam it is possible to map out the spatial phase and intensity of such a beam.
[1] M. Krüger, M. Schenk, P. Hommelhoff, Nature 475, 78 (2011).
[2] T. Rathje et al., J. Phys. B: AMOP 45, 074003 (2012).