Hannover 2013 – scientific programme

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MS: Fachverband Massenspektrometrie

MS 9: Accelerator Mass Spectrometry and Applications II

MS 9.4: Talk

Thursday, March 21, 2013, 12:00–12:15, F 442

Ion source memory in ³⁶Cl accelerator mass spectrometry — •Stefan Pavetich¹, Shavkat Akhmadaliev¹, Maurice Arnold², Georges Aumaître², Didier Bourlès², Josef Buchriegler³, Robin Golser³, Karim Keddadouche³, Martin Martschini², Silke Merchel¹, Georg Rugel¹, and Peter Steier³ — ¹HZDR, Dresden, Germany — ²ASTER, Aix-en-Provence, France — ³VERA,Vienna, Austria

Since the DREAMS (Dresden Accelerator Mass Spectrometry) facility went operational in 2011, constant effort was put into enabling routine measurements of long-lived radionuclides as ¹⁰Be, ²⁶Al and ⁴¹Ca. For precise AMS-measurements of the volatile element Cl the key issue is the minimization of the long term memory effect [1]. For this purpose one of the two original HVE sources was mechanically modified, allowing the usage of bigger cathodes with individual target apertures. Additionally a more open geometry was used to improve the vacuum level. To evaluate this improvement in comparison to other up-to-date ion sources, a small interlaboratory comparison had been initiated. The long-term memory effect in the Cs sputter ion sources of the AMS facilities VERA, ASTER and DREAMS had been investigated by running samples of natural ³⁵Cl/³⁷Cl-ratio and samples containing highly enriched ³⁵Cl (³⁵Cl/³⁷Cl > 500). Primary goals of the research are the time constants of the recovery from the contaminated sample ratio to the initial ratio of the sample and the level of the long-term memory effect in the sources.

[1] R. Finkel et al., NIMB 294 (2013) 121.