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K: Fachverband Kurzzeitphysik
K 1: Optische Methoden und Verfahren
Montag, 25. Februar 2013, 14:00–15:30, HS 4
14:00 | K 1.1 | Hauptvortrag: Physikalische Messung am Beispiel von Photo und Film — •Rudolf Germer | |
14:30 | K 1.2 | Observing surface charges in oxide coatings on silicon surfaces with THz emission spectroscopy — •Ulrike Blumröder, Stefan Nolte, and Andreas Tünnermann | |
14:45 | K 1.3 | Time-resolved measurements of magnetization precession in different exchange bias systems — •Andrea Ehrmann and Tomasz Blachowicz | |
15:00 | K 1.4 | Magnetization oscillations and rapid transient states in ferromagnetic nano-half-balls and wire systems with shape modifications — •Tomasz Blachowicz and Andrea Ehrmann | |
15:15 | K 1.5 | Mass-selective discrimination of chirality by femtosecond coincidence imaging — •Carl Stefan Lehmann, Bhargava Ram, Ivan Powis, and Maurice Janssen | |