Jena 2013 – wissenschaftliches Programm

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P: Fachverband Plasmaphysik

P 12: Plasmadiagnostik II

P 12.7: Vortrag

Donnerstag, 28. Februar 2013, 12:45–13:00, HS 2

Non-invasive, electron beam based profile measurement of strongly focused, intense heavy ion beams — •Said El Moussati — TU Darmstadt, Darmstadt, Deutschland

Due to determine the transverse intensity distribution of strongly focussed, high intensity heavy ion beams, an electron beam diagnostic device is presently under development at the HHT experimental area at GSI Darmstadt. This method is based on the deflection of the electrons after passing through the electric field of the ion beam. The results of an offline-experiment and the proposed experimental setup will be presented in this talk.