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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 1: Nanoparticles and Composite Materials I
CPP 1.5: Talk
Monday, March 11, 2013, 10:45–11:00, H34
Structure and morphology of hybrid thin films for non-volatile memories — •Jiří Novák1, Giulia Casula2, Rupak Banerjee1, Christian Frank1, Alexander Gerlach1, Katharina Broch1, Piero Cosseddu2, Annalisa Bonfiglio2, and Frank Schreiber1 — 1Universität Tübingen, Institut für Angewandte Physik, Auf der Morgenstelle 10, 72076 Tübingen — 2University of Cagliari, DIEE, Piazza d’Armi, 09123 Cagliari, Italy
Recently, hybrid thin films comprising metal nanoparticles (NPs) embedded in an organic semiconductor (OSM) matrix became attractive as constituents of non-volatile resistive memories [1,2]. The control of the structure of hybrid films via growth parameters is of crucial interest to tailor the electric properties of the memory elements.
We present a structural study on the formation of Al NPs atop thin organic films
(small molecule OSM N1400 by Polyera). The films were prepared via thermal evaporation on Si substrates
for various organic film thicknesses and at various Al growth rates. The combined GISAXS, X-ray reflectivity,
and AFM study shows that the Al cluster distance and size depend mainly on the organic layer morphology controlled by its thickness. On the other hand, the Al NPs layer structure is weakly sensitive to the Al deposition rate.
This is in a strong contrast to, e.g., growth of Au on top of DIP layers, where rather Au
growth rate and substrate temperature play a crucial role [3].
L.D. Bozano et al., Adv. Funct. Mater., 15, 1993 (2005);
[2] Liping Ma et al., Appl. Phys. Lett., 82, 1419 (2003);
[3] F. Schreiber, Phys. Stat. Sol., 201, 1307 (2004);