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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 14: Crystallization, Nucleation and Self Assembly I
CPP 14.10: Talk
Tuesday, March 12, 2013, 12:00–12:15, H39
Real time and in-situ investigations of the nucleation and diffusion during the growth of the fullerene C60 using X-ray scattering — •Sebastian Bommel1,2, Nicola Kleppmann3, Christopher Weber2, Holger Spranger2, Jiri Novak4, Peter Schäfer2, Stephan V. Roth1, Frank Schreiber4, Sabine H.L. Klapp3, and Stefan Kowarik2 — 1Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany — 2Institut für Physik, Humboldt-Universität Berlin, Berlin, Germany — 3Institut für Theoretische Physik, Technische Universität Berlin, Berlin — 4Institut für Angewandte Physik, Universität Tübingen, Tübingen, Germany
The surface morphology and the structural order during the growth of the popular organic semiconductor C60 were studied with simultaneous real-time and in-situ measurements of Grazing Incidence Small-Angle X-ray Scattering (GISAXS) and anti-Bragg growth oscillations during organic molecular beam deposition . For the characterization of the morphology during the growth the island density was extracted from 2D GISAXS patterns. From this we find a dependency of the island density on thickness and also temperature, i.e. 150 islands/µm2 for 313 K and 10 islands/µm2 for 353 K in the beginning of growth. From the anti-Bragg growth oscillations high structural order and layer-by-layer growth during the growth of multilayer films were found. From a comparison of the nucleation and the growth oscillations with the analytic Trofimov rate equations model and KMC simulations the diffusion energy and the Ehrlich-Schwoebel barrier can be estimated to be 0.5 eV and 0.1 eV, respectively.