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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 16: Interfaces and Thin Films II (joint session with DECHEMA and VDI)

CPP 16.5: Vortrag

Dienstag, 12. März 2013, 10:45–11:00, H40

Investigation of structure and molecular nature of the conjugated polymer films by hard and soft x-ray reflectivity and XAFS in reflection mode — •Arman Davtyan, Souren Grigorian, Dmitry Ksenzov, and Ullrich Pietsch — University of Siegen, Siegen, Germany

Structural and optical properties of the conjugated polymers were measured close and outside the K- absorption edge of carbon. Hard and soft x-ray reflectivity measurements are characterizing samples made of P3AT (poly(3-alkylthiophene)) thin films covered onto SiO₂ coated silicon substrates. The general structures of films were determined by combined fitting of hard and soft x-ray reflectivity curves. Additional chemical information was taken from the shape of curves taken by ReflEXAFS in the energy range of the Carbon K-edge (275-340 eV). It turns out that structural properties depend on the preparation technique used. Considering all information a three-layer model was appropriate to simulate the hard and soft x-ray reflection curves and the C K-edge ReflEXAFS profiles of the spin coated thin films.