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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 42: New Instruments and Methods
CPP 42.3: Vortrag
Donnerstag, 14. März 2013, 12:00–12:15, H39
Nanocharacterization of Organic Semiconductors using NanoXAS, a Combined Scanning Transmission X-ray Microscopy/Scanning Probe Microscopy instrument — Peter Warnicke1, Nicolas Pilet1, Benjamin Watts1, Rainer Fink2, Christoph Quitmann1, and •Jörg Raabe1 — 1Paul Scherrer Institut, 5232 Villigen, Switzerland — 2Univ. Erlangen-Nürnberg, 91058 Erlangen, Germany
Properties of organic semiconducting materials are strongly linked to the interplay between chemical composition and microstructure. As techniques providing simultaneous information on these characteristics are lacking there is a great need for more complete characterization tools. Here we present a novel instrument (NanoXAS) which combines two powerful techniques, scanning probe microscopy (SPM) and x-ray absorption spectroscopy (XAS), in order to fully characterize organic semiconducting materials and devices. SPM can measure physical properties such as sample topography, elasticity, adhesion, or friction on lateral scales down to nanometers. XAS gives direct access to the local chemical composition, electronic structure, molecular orientation, order, and absolute density. The instrument consists of a SPM and a scanning transmission x-ray microscope (STXM) in a coaxial arrangement. A semi-transparent sample is scanned through the x-ray beam and the transmitted x-rays are detected by a photodiode or by a SPM tip thus enabling high-resolution imaging with element sensitivity. To demonstrate the function of the instrument we present measurements on polymers and polymer blends.