Regensburg 2013 – scientific programme

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 9: Poster: Interfaces and Thin Films (joint session with DECHEMA and VDI)

CPP 9.22: Poster

Monday, March 11, 2013, 17:30–19:30, Poster C

Real-time studies on annealing of Tetratetracontane (TTC) by X-Ray diffraction — •Linus Pithan¹, Andreas Opitz¹, Alexander Hinderhofer², Eduard Meister³, Christian Frank², Michael Kraus³, Wolfgang Brütting³, Frank Schreiber², and Stefan Kowarik¹ — ¹Humboldt Universität Berlin — ²Universität Tübingen — ³Universität Augsburg

TTC (C₄₄ H₉₀) is e.g. used as dielectric interlayer in organic field-effect transistors [1]. For such devices large molecular grains with smooth surfaces are crucial. Here we report real time grazing incidence X-Ray diffraction (GIXD) measurements monitoring the annealing process of TTC thin films on silicon dioxide previously deposited by vapor deposition. Furthermore atomic force microscopy (AFM) and X-Ray reflectivity (XRR) results are presented. We find that randomly oriented and lying molecules on the surface rearrange into standing up molecules and fill subjacent layers [2]. By AFM measurements it can be shown that islands of molecules form large terraces in the annealing process.

[1] Kraus et al.; Organic Electronics, 12, 5, May 2011, 731-735, DOI:10.1016/j.orgel.2011.02.001

[2] Weber et al.; J. Chem. Phys. 136, 204709 (2012), DOI:10.1063/1.4719530