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DF: Fachverband Dielektrische Festkörper
DF 12: Poster 1
DF 12.38: Poster
Tuesday, March 12, 2013, 10:30–13:30, Poster D
Magneto-resistive characterization of hybrid magnetic films — •Kadir Sentosun1, Julia Trützschler1, Manuel Langer2, Ingolf Mönch3, Roland Mattheis4, Thomas von Hofe1, Jurgen Fassbender2, and Jeffrey McCord1 — 1Institute for Material Science, University Kiel, Germany — 2Helmholtz-Zentrum Dresden-Rossendorf, Germany — 3Leibniz Institute for Solid State and Materials Research, Dresden, Germany — 4Institute of Photonic Technology, Jena, Germany
Thin films with an initial unidirectional anisotropy are patterned by ion irradiation [1] into stripe-like two dimensional structures with alternating directions of exchange bias (EB). By this a structure with laterally varying perpendicular alignment of EB is obtained. The magnetization behaviour of the NiFe/IrMn thin films is investigated by complementary methods: Structures of different stripe width are analysed by inductive magnetometry, the change of anisotropic magneto-resistance (AMR) with varying field angles is investigated by a four probe contact measurement technique, and the magnetization reversal is studied by Kerr microscopy. Transversal magnetization components related to domain wall activity are derived from the AMR measurements. The characteristic AMR sensitivity is maximized when the measuring current direction is along the net magnetization, also oriented parallel to the applied magnetic field direction. Pure uniaxial magnetic field sensitivity is obtained through the perpendicularly aligned magnetization modulation. [1] J. Fassbender and J. McCord, J. Magn. Magn. Mater. 320, 579-596 (2008)