Regensburg 2013 – scientific programme

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DF: Fachverband Dielektrische Festkörper

DF 19: Poster 2

DF 19.9: Poster

Wednesday, March 13, 2013, 15:00–17:30, Poster B2

Determination of the quality factor of microstructured dielectric surfaces by wave-front reconstruction — •Kay-Michael Voit, Hauke Bruening, Juliane Tschentscher, and Mirco Imlau — School of Physics, Osnabrueck University, Osnabrueck, Germany

We present our research results on the determination of the quality factor Q of micro- and nanostructured surfaces by means of (non-)linear light-matter interaction. Such structured surfaces play an important role in the field of advanced functional materials e.g. in nonlinear optics/photonics. However, there is so far no method for a contact-free, nondestructive control of the structure during synthesis and/or probing the structures’ lifetime. First, an experimental setup for the optical measurement of periodic micro- and nanostructured surfaces within the range of 0<Q<1 an δ Q =0.1 is presented. Taking into account the related boundary conditions, we show simulations of the optical far-field pattern resulting from microstructures with different quality factors. The wave front reconstruction is performed by a mixture of ray-tracing and Fresnel-Huygens/Kirchhoff diffraction theory. Possibilities for in-field application and calibration are discussed and a comparison between theoretical and experimental results is given.