Regensburg 2013 – wissenschaftliches Programm
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DF: Fachverband Dielektrische Festkörper
DF 22: Poster II
DF 22.25: Poster
Freitag, 15. März 2013, 10:30–13:30, Poster D
An oxide MBE system as a user instrument for quasi in-situ neutron reflectometry studies — •Sabine Pütter1, Alexandra Steffen1, Stefan Mattauch1, and Thomas Brückel1,2 — 1Jülich Centre for Neutron Science JCNS, Forschungszentrum Jülich GmbH, Outstation at FRM II, Lichtenbergstr. 1, 85747 Garching — 2Jülich Centre for Neutron Science JCNS and Peter Grünberg Institute, JCNS-2, PGI-4: Scattering methods, Forschungszentrum Jülich GmbH, 52425 Jülich
Molecular Beam Epitaxy (MBE) is a fascinating method to deposit high quality epitaxial thin films. The Jülich Centre for Neutron Science (JCNS) opens its state-of-the-art MBE system at the FRM II in Garching to friendly users who are interested in preparing tailored samples for the investigation with the JCNS neutron reflectometer MARIA (magnetic reflectometer with high incident angle) or other methods.
The MBE is equipped with 6 effusion cells, two electron guns for electron-beam evaporation with 4 crucibles each and an oxygen plasma source. Standard in-situ surface analysis tools like reflection high and low energy electron diffraction, Auger electron spectroscopy analysis are also available.
We will give examples for high quality metal and complex oxide thin film systems like e.g. La1−xSrxMnO3/SrTiO3 with focus on stoi-chiometry, morphology and thickness and give detailed information about what kind of samples we can provide to you.