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DF: Fachverband Dielektrische Festkörper
DF 22: Poster II
DF 22.44: Poster
Freitag, 15. März 2013, 10:30–13:30, Poster D
Time-Resolved Magnetic Imaging in an Energy-Filtered, Aberration-Corrected Photoemission Electron Microscope — •Florian Nickel1, Daniel Gottlob1, Ingo Krug1, Alexander M. Kaiser2, Denys Makarov3, Gungun Lin3, Stefan Cramm1, Hatice Doganay1, Oliver G. Schmidt3, and Claus M. Schneider1,4 — 1Peter Grünberg Institut 6, Research Center Jülich, 52425 Jülich — 2SPECS Surface Nano Analysis GmbH, 13355 Berlin — 3Institute for Integrative Nanosciences, IFW Dresden, Helmholtzstr. 20, 01069 Dresden — 4Fakultät für Physik und Center for Nanointegration Duisburg-Essen (CeNIDE), Universität Duisburg-Essen, 47048 Duisburg
Information technology relies on reliable storage and fast switching of material states. These states can be governed either by magnetic or electrical degrees of freedom, which offers a wide variety of design concepts. Common to all storage concepts is that manipulation of the information state takes place on a characteristic time and length scale, which is in the picosecond respective nanometer range. All requirements are combined in the method of time-resolved photoemission microscopy (TR-PEEM). Recently, we installed a state-of-the-art PEEM with energy-filtering system and aberration corrector (FE LEEM-P90 AC by SPECS) at the FZ-Jülich Beamline UE56/1-SGM @ BESSY. In this poster we present the extension of the microscope setup for synchrotron pump-probe measurements. We will present details about the technical performance of the setup as well as first results on magnetization dynamics in ferromagnetic nanoelements.