Regensburg 2013 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 13: Poster Session III: Layer properties: electrical, optical and mechanical properties; Thin film characterization: structure analysis and composition (XRD, TEM; XPS, SIMS, RBS..)

DS 13.12: Poster

Montag, 11. März 2013, 17:00–20:00, Poster B1

Thick manganite films grown by MAD — •F. Fischgrabe¹, E.S. Zhukova^2,3, B. Gorshunov^2,3, M. Dressel³, and V. Moshnyaga¹ — ¹I. Physikalisches Institut, Universität Göttingen, Germany — ²Prokhorov General Physics Institute, Russian Academy of Sciences,Moscow, Russia — ³I. Physikalisches Institut, Universität Stuttgart, German

We report preparation and characterization of La_1−xCa_xMnO₃ (LCMO) x=0,3-0,5 films with thickness 1−10 µ m. Thick epitaxial manganite films could be interesting for THz as well as for far IR Fourier spectroscopy measurements, aimed to study low-energy excitations, like CDW and folding phonons, important for the manganite physics. The samples were grown using metalorganic aerosol deposition (MAD) technique. To verify the film quality XRD, DC and AC resistivity (f=0,1Hz-40MHz; T=5-300K), STM, REM and THz measurements were carried out. 1 µ m-thick LCMO films with x=1/3 show a metal-insulator transition at T=272 K and residual resistivity, ρ(5K) ≈ 10⁻⁴ Ω cm, i.e. the values characteristic for thin epitaxial LCMO films. XRD measurements demonstrate out-of-plane texture with c=0.3864 nm very close to the bulk value as well as single phase composition. The results show the MAD potential to produce high quality thick oxide films for industrial applications, like coating conductors.