Regensburg 2013 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 13: Poster Session III: Layer properties: electrical, optical and mechanical properties; Thin film characterization: structure analysis and composition (XRD, TEM; XPS, SIMS, RBS..)
DS 13.6: Poster
Montag, 11. März 2013, 17:00–20:00, Poster B1
Synthesis, microstructure and local electronic conductivity of platinum/titanium oxide contacts — •Marian Bongers, Astrid Pundt und Carsten Nowak — Institut fuer Materialphysik, Friedrich-Hund-Platz 1, 37077 Goettingen, Germany
Pt/TiOx Schottky contacts are of interest for surface chemical reactions as they allow measuring hot electrons, show catalytic activity and exhibit a change in there electronic characteristics under different chemical ambient. As these effects depend on the crystallographic orientation, a careful characterization of the microstructure is required.
Here we present studies on the growth of TiO2/Pt double layers on MgO <100> single crystals. Layers with several hundred nanometers thickness were prepared by reactive atom beam sputter deposition under O2 and Xe atmosphere. The layers were structurally characterized by XRD, EBSD and AFM. For optimized synthesis temperature the investigations revealed a preferred <100> orientation of the Pt layer with lateral grain size of the order of 100 µm. For the TiO2 layers a polycrystalline microstructure was observed. Local I-V-characteristics were measured with conductive AFM and tungsten tips of µm size, revealing rectifying behavior.
Further, investigations on the influence of the deposition temperature and thermal annealing on the quality of the TiO2 layers are presented. The influence of a chemical gas ambient on the I-V-characteristics of the synthesized Pt/TiOx contacts will be discussed.
Fincanial support by the DFG via projects PU131/9 and SFB602 is gratefully
acknowledged.