Regensburg 2013 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 13: Poster Session III: Layer properties: electrical, optical and mechanical properties; Thin film characterization: structure analysis and composition (XRD, TEM; XPS, SIMS, RBS..)

DS 13.9: Poster

Montag, 11. März 2013, 17:00–20:00, Poster B1

Preparation of equiatomic FeRh thin film by MBE — •Alireza Heidarian^1,2, Kay Potzger¹, Jürgen Lindner¹, and Rantej Bali¹ — ¹HZDR Institute of Ion-Beam Physics and Materials Research P.O. Box 510119, 01314 Dresden, Germany — ²TU Dresden Helmholtzstr. 10, 01069 Dresden, Germany

High quality equiatomic FeRh thin films with varying thickness have been prepared on MgO (100) substrates via molecular beam epitaxy (MBE). The optimization of the stoichiometry was monitored using XRD, RBS and AES while the magnetic properties were probed in a SQUID. XRD results evidence a well-ordered CsCl-type crystal structure. By increasing the annealing temperature of the films, the structural quality of the films also increase. Moreover, the known first order phase transition at ~350 K from an antiferromagnetic (AF) to a ferromagnetic (FM) state slightly shifts towards higher temperatures. M-H loops of films annealed at 800 °C or 850 °C recorded at 300 K show an opening, which is likely related to the magnetic field-induced AFM-FM phase transition[1]. Residual low-temperature ferromagnetic moments are related to disorder or Fe diffusion towards the interfaces.[1] J. Cao, T. Nam, N. Phuoc and T. Suzuki. J. Appl. Phys 103, 07F501 (2008).