Regensburg 2013 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 23: Focus Session: Thin Film Photovoltaic Materials and Solar Cells II
DS 23.3: Vortrag
Mittwoch, 13. März 2013, 15:15–15:30, H8
Laser Based Shunt Removal of Silicon and Chalcopyrite based Thin Film Solar Cells — •Christof Schultz1, Manuel Schüle1, Sven Kühnapfel3, Kamil Stelmaszczyk1, Moshe Weizman1, Holger Rhein2, Björn Rau2, Rutger Schlatmann1,2, Volker Quaschning1, Bert Stegemann1, and Frank Fink1 — 1HTW Berlin - University of Applied Sciences, Wilhelminenhofstr. 75a, 12459 Berlin, Germany — 2PVcomB/ Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Schwarzschildstr. 3, D* 12489 Berlin, Germany — 3Helmholtz-Zentrum für Materialien und Energie, Institut für Silizium-Photovoltaik, D-12489 Berlin, Germany
In commercial thin film solar cell production defective areas can occur due to material impurities or by "rough" sample handling between the different deposition steps. Such defects can cause disproportionate losses or even shortcuts in the solar cells. The removal of these defects would increase the solar cell performance as well as the overall manufacturing yield. In our study we present a technique for identification of shunted regions by means of lock-in thermography and successful laser based removal of shunts in silicon and chalcopyrite thin film solar cells. These results show that the removal of point-like defects increases the overall device performance significantly.