Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 30: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...) II

DS 30.5: Vortrag

Donnerstag, 14. März 2013, 15:45–16:00, H32

Substrate strains measured by convergent beam electron diffraction in epitaxial Ba(Fe1-xCox)2As2 thin films — •Paul Chekhonin¹, Jan Engelmann², Bernhard Holzapfel², Bernd Rellinghaus², Carl-Georg Oertel¹, and Werner Skrotzki¹ — ¹Institut für Strukturphysik, Technische Universität Dresden — ²Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden

Epitaxial Ba(Fe1-xCox)2As2 thin films have been produced by pulsed laser deposition on a spinel substrate with an iron buffer layer. Using the convergent beam electron diffraction technique in the transmission electron microscope, it is possible to obtain a Kossel pattern of the substrate. Strain-induced changes of the lattice parameters are derived from the captured Kossel pattern of substrate areas close to the interface with the iron buffer layer. The in-plane lattice parameters increase with respect to bulk spinel, giving evidence, that the strain in the Ba(Fe1-xCox)2As2 thin film is mainly determined by the iron buffer layer, and not by the substrate.