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DS: Fachverband Dünne Schichten
DS 30: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...) II
DS 30.9: Vortrag
Donnerstag, 14. März 2013, 16:45–17:00, H32
EBSD on thin FePtCu films to investigate the influence of copper content and annealing temperature on (001) texture formation and grain size — •Nathanael Jöhrmann, Herbert Schletter, Christoph Brombacher, Manfred Albrecht, and Michael Hietschold — Institut für Physik, Technische Universität Chemnitz, 09107 Chemnitz
FePt shows a very high uniaxial magnetocrystalline anisotropy in its chemical ordered L10 phase. Therefore thin FePt films are a promising candidate to raise the storage density of magnetic storage devices. For such applications it is necessary to grow films with (001) texture. The addition of copper can improve the texture formation during annealing [1-2]. To further investigate the influence of copper content on the texture formation and grain size, Electron Backscatter Diffraction (EBSD) measurements on 5-nm-thick FePtCu films with variable copper content from 0 at. % up to 21 at. % were performed. The films were prepared by magnetron sputtering of Cu/FePt bilayers at room temperature on thermally oxidized Si(100) substrates, followed by rapid thermal annealing to 600 ∘C for 30 s. Studies were also carried out for 15-nm-thick FePtCu films, where the annealing temperature has been varied from 500 ∘C to 700 ∘C.
Our findings suggest that copper primarily promotes nucleation of L10 (001) grains, while a higher heating temperature accelerates the crystallite growth.
[1] C. Brombacher et al., J. Appl. Phys. 112, 073912 (2012)
[2] M. Maret et al., Phys. Rev. B 86, 024204 (2012)