Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 31: Organic thin films II

DS 31.7: Vortrag

Donnerstag, 14. März 2013, 16:15–16:30, H8

In-situ x-ray scattering studies of co-evaporated organic thin films: Dependence on mixing ratio — •Rupak Banerjee, Jiří Novák, Christian Frank, Alexander Gerlach, and Frank Schreiber — Institut für Angewandte Physik - Universität Tübingen, Tübingen, Germany

Organic molecular semiconductors have attracted substantial research interests due to their attractive optical, structural and electronic properties [1]. The efficiency of an organic photovoltaic (OPV) composed of organic semiconductors mainly depends on the diffusion length of the generated exciton and the charge carrier collection at the electrodes [1]. For applications in the OPV, further enhancement of efficiency can be achieved by mixing donor and acceptor organic semiconducting molecules. One of the ways of tailoring this is by changing the mixing ratio of the constituents during co-evaporation. We present in-situ and real-time depth resolved grazing incidence x-ray diffraction, grazing incidence small angle scattering and x-ray reflectivity studies on the structure of mixed C60 and Diindinoperylene (DIP) films as a function of mixing ratio. We observe enhancement in the out-of-plane ordering (very smooth films up to 20 nm) upon co-evaporation of C60:DIP thin films (in different mixing ratio) which are otherwise well known to phase separate. We also observe differences in the size of the grains of the co-evaporated thin film on changing the mixing ratio.

[1] A. Hinderhofer and F. Schreiber, Chem. Phys. Chem. 13, 628 (2012).