Regensburg 2013 – wissenschaftliches Programm

Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

DS: Fachverband Dünne Schichten

DS 32: Poster Session IV: Atomic layer deposition; Organic thin films; Organic Electronics and Phototovoltaics; Organic Materials for Spintronics - from spinterface to devices; Thin film photovoltaic materials and solar cells

DS 32.16: Poster

Donnerstag, 14. März 2013, 17:00–20:00, Poster B2

Electrical characterization of selected matrix dopant systems via U-I measurements — •Markus Gölz^{1, 4}, Daniela Donhauser^{2, 4}, Eric Mankel^{3, 4}, Wolfram Jaegermann^{3, 4}, and Wolfgang Kowalsky^{1, 2, 4} — ¹Kirchhoff-Institut für Physik, Universität Heidelberg — ²Technische Universität Braunschweig — ³Technische Universität Darmstadt — ⁴Innovation Lab GmbH, Heidelberg

Understanding the electrical effects of doping of organic materials is necessary to produce efficient organic devices, such as OLEDs or organic solar cells. The electrical conductance of selected matrix dopant systems is investigated via current - voltage (I-V) measurements. Typical matrices are α-NPD(NPB), CuPc and CBP. F4-TCNQ and HATNA-F6 are used as dopants. The samples are made by thermal coevaporation under UHV conditions. The electrical measurements are carried out at room temperature and atmospheric conditions.

Specifically the α-NPD: F4-TCNQ (2.7%) samples show an increase of the conductance of a factor of ten compared to the undoped matrix. Furthermore, the space-charged-limited-current region (SCLC) in the doped matrix is shifted to higher voltages. It sets in at approximately 1.5 V compared to 0.1 V in the undoped matrix.