Regensburg 2013 – scientific programme
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DS: Fachverband Dünne Schichten
DS 32: Poster Session IV: Atomic layer deposition; Organic thin films; Organic Electronics and Phototovoltaics; Organic Materials for Spintronics - from spinterface to devices; Thin film photovoltaic materials and solar cells
DS 32.38: Poster
Thursday, March 14, 2013, 17:00–20:00, Poster B2
Domain dimensions, in-plane orientation and chemical contrast at the nanoscale: X-ray spectromicroscopy studies of organic molecules and polymers — •Anton Zykov1, Robert Steyrleuthner2, Marcel Schubert2, Tayfun Mete3, Konstantinos Fostiropoulos3, Peter Guttmann3, Stephan Werner3, Katja Henzler3, Gerd Schneider3, Dieter Neher2, and Stefan Kowarik1 — 1Inst. of Physics, HU Berlin — 2Inst. of Physics, University of Potsdam — 3HZB, Berlin
Transmission X-ray microscopy (TXM) at the U41-TXM beamline at BESSY, Berlin was carried out to study polymers and molecules used for different organic optoelectronic devices. We investigate the polymers P3HT and P(NDI2OD-T2), which are photoactive materials for organic solar cells, and diindenoperylene (DIP) heterostructures as applied in OFET’s. The films were deposited by spin-coating and OMDB under variation of the preparation conditions, e.g. choice of solvent, blend ratio, post-annealing temperatures and film thickness. The dimensions of domains ranging from 40 to 500nm were analyzed with the TXM resolution of ∼30nm at the C K-edge. By measurements of the polarization dependency we obtain information about the orientation of polymer backbones and molecules in the domains, which strongly influences their optoelectronic properties. Due to the difference in the x-ray absorption energies of the used materials we got chemical contrast of blends at a nanoscale. These results will be correlated with the properties of the materials and conclusions will be drawn regarding the processes influencing the efficiency of the devices.