Regensburg 2013 – wissenschaftliches Programm

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HL: Fachverband Halbleiterphysik

HL 70: Poster Session: Devices; Preparation and characterization; C/diamond; Si/Ge

HL 70.12: Poster

Mittwoch, 13. März 2013, 16:00–20:00, Poster A

Determination of the Depth of Shallow Implanted NV Centers in Diamond by Confocal Microscopy and Statistics — •Andreas Häußler, Pascal Heller, and Fedor Jelezko — Institut für Quantenoptik, Universität Ulm, Albert-Einstein-Allee 11, 89081 Ulm, Germany

Nitrogen-Vacancy (NV) color centers in diamond are interesting candidates for magnetic sensing in solid state. However, to measure a magnetic field outside of the diamond, the NV probe has to be positioned close to the point of interest, i.e. near the surface of the diamond. For the sake of good sensitivity and precision, knowing the exact depth of a NV center below the surface is crucial.

In our work we use a simple confocal microscope and measure both the reflected light from the surface and the emitted light of the NV to determine the depth of the color center. A statistical evaluation of the data can then lead to a much higher precision than the point spread function of the microscope down to nanometer accuracy.