Regensburg 2013 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
MA: Fachverband Magnetismus
MA 36: Magnetic Measurement Techniques
MA 36.7: Vortrag
Donnerstag, 14. März 2013, 11:15–11:30, H3
Quantitative magnetic force microscopy with out-of-plane and in-plane sensitivity — •Christopher Friedrich Reiche1, Thomas Mühl1, Silvia Vock1, Volker Neu1, Albrecht Leonhardt1, Ludwig Schultz1,2, and Bernd Büchner1,2 — 1Leibniz-Institut für Festkörper- und Werkstoffforschung IFW Dresden — 2Institut für Festkörperphysik, Technische Universität Dresden
Magnetic force microscopy (MFM) is a powerful tool for mapping the spacial distribution of one component of the stray field gradient above a magnetic sample surface. We use iron filled carbon nanotubes (FeCNT) as monopole-like magnetic tips that can be easily calibrated [1] to make quantitative MFM possible.
In standard MFM only the out-of-plane stray field component is detected. By oscillating the cantilever with a higher flexural mode we are able to measure not only the out-of-plane component but also the in-plane component with the same sensor [2].
In our recent experiments we improved the sensitivity of the in-plane measurement. Furthermore, we characterized the FeCNT sensor in both directions and confirmed the expected isotropic properties with respect to its effective monopole moment. This makes multiple component quantitative MFM possible with a single calibration measurement.
[1] F. Wolny, T. Mühl, U. Weissker, K. Lipert, J. Schumann, A. Leonhardt, and B. Büchner, Nanotechnology 21, 435501 (2010)
[2] T. Mühl, J. Körner, S. Philippi, C. F. Reiche, A. Leonhardt, and B. Büchner, Appl. Phys. Lett. 101, 112401 (2012)