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MI: Fachverband Mikrosonden

MI 1: Topical Session: Using Transmission Electron Microscopy to Unravel the Mysteries of Materials I - Joint Session with MM

MI 1.2: Topical Talk

Montag, 11. März 2013, 10:45–11:15, H4

Application of Electron Energy-Loss Spectroscopy to Study Nanostructures and Interfaces — •Christina Scheu — Department of Chemistry & Center for NanoScience, Ludwig-Maximilians-University of Munich, 81377 Munich, Germany

Electron energy-loss spectroscopy (EELS) in the transmission electron microscope (TEM) provides information on the optical properties, the chemical composition and the electronic structure of materials down to the nanometer regime or even below. These informations are obtained by analyzing the spectral features occurring in the low-loss region (up to energy-losses of around 50 eV) or with the help of the element-specific ionization edges which are found in the core-loss region (above 50 eV). In this talk the different features are discussed under the impact of possible interface and nanostructure investigations. It will be shown that the band gap of individual semiconducting oxide nanosheets can be obtained by comparing experimental data acquired with a monochromated TEM to density functional theory calculations. Furthermore, electronic structure changes occurring at strained oxide-oxide interface will be presented. These changes can be investigated by analyzing the electron energy-loss near-edge structure which is associated with each element-specific ionization edge and which contains information on e.g. bonding characteristics and nominal oxidation states of the probed interfacial atoms.