Regensburg 2013 – scientific programme

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MI: Fachverband Mikrosonden

MI 10: Scanning Probe Microscopy

MI 10.1: Talk

Thursday, March 14, 2013, 09:30–09:45, H5

Interaction Imaging with Amplitude-dependence Force Spectroscopy — •Daniel Platz¹, Daniel Forchheimer¹, Erik Tholén², and David Haviland¹ — ¹Royal Institute of Technology (KTH), Nanostructure Physics, Albanova University Center, SE-106 91 Stockholm, Sweden — ²Intermodulation Products AB, Vasavägen 29, SE-169 58 Solna, Sweden

The ultimate goal in atomic force microscopy (AFM) is the combination of imaging with accurate force measurement. Dynamic AFM offers only qualitative information about the tip-surface interaction while imaging, because the sharp cantilever resonance efficiently filters out the high frequency components of the tip-surface. Traditional force measurements are based on slow, point-wise surface approaches and are incompatible with imaging. Here, we present a method called amplitude-dependence force spectroscopy (ADFS) that enables quantitative dynamic force reconstruction at every point of an AFM image, while scanning at normal speeds [1]. ADFS breaks with the paradigm of constant tip oscillation amplitude, as the oscillation amplitude is rapidly modulated at every image point. The measured response gives the amplitude-dependence of the Fourier component of the force at the resonant frequency, which allows for a model-free reconstruction of the tip-surface. We have made rigorous tests of ADS using numerical simulations and have used it for a detailed study of the mechanical properties of polymer surfaces.

[1] Platz et al., accepted for publication in Nature Communications