MI 10: Scanning Probe Microscopy
Donnerstag, 14. März 2013, 09:30–11:15, H5
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09:30 |
MI 10.1 |
Interaction Imaging with Amplitude-dependence Force Spectroscopy — •Daniel Platz, Daniel Forchheimer, Erik Tholén, and David Haviland
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09:45 |
MI 10.2 |
Adapting the Principle of Atomic Force Microscopy for Highly Resolved Measurements of Atmospheric Turbulence with the 2D-Atmospheric Laser Cantilever Anemometer — •Ingrid Neunaber, Jaroslaw Puczylowski, Joachim Peinke, and Michael Hölling
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10:00 |
MI 10.3 |
Chemical Resolution with nc-AFM in InSn Mixed Atomic Chains on Si(100) — Martin Setvín, Pingo Mutombo, •Martin Ondráček, Zsolt Majzik, Vladimír Cháb, Ivan Ošťádal, Pavel Sobotík, and Pavel Jelínek
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10:15 |
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15 min. break
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10:30 |
MI 10.4 |
Kelvin Probe Force Microscopy in Liquids — Anna Domanski, Esha Sengupta, Karin Bley, Stefan Weber, Maria Untch, Clemens Weiss, Katharina Landfester, Hans-Jürgen Butt, and •Rüdiger Berger
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10:45 |
MI 10.5 |
k-space Imaging of the Eigenmodes on a Sharp Gold Taper for Near-field Scanning Optical Microscopy — •M. Esmann, B. B. da Cunha, S. F. Becker, J. H. Brauer, P. Gross, and C. Lienau
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11:00 |
MI 10.6 |
Confocal Raman Microscopy: True Surface and 3D Raman Imaging — Ute Schmidt, •Max Stadler, Thomas Dieing, and Olaf Hollricher
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