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MI: Fachverband Mikrosonden

MI 1: Topical Session: Using Transmission Electron Microscopy to Unravel the Mysteries of Materials I - Joint Session with MM

Montag, 11. März 2013, 10:15–11:30, H4

	10:15	MI 1.1	Topical Talk: The potential of valence electron energy-loss spectroscopy to probe local optical properties and band structure information in scanning transmission electron microscopy — •Rolf Erni
	10:45	MI 1.2	Topical Talk: Application of Electron Energy-Loss Spectroscopy to Study Nanostructures and Interfaces — •Christina Scheu
	11:15	MI 1.3	Effect of lens aberrations on strain measurements from Convergent Beam Electron Diffraction patterns — •Christoph Mahr, Knut Müller, Andreas Rosenauer, Marco Schowalter, Daniel Erben, Josef Zweck, and Pavel Potapov