MI 2: Topical Session: Using Transmission Electron Microscopy to Unravel the Mysteries of Materials II - Joint Session with MM
Montag, 11. März 2013, 11:45–13:15, H4
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11:45 |
MI 2.1 |
Hauptvortrag:
Prospects for mapping spins with atomic resolution in TEM — •Johan Verbeeck
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12:15 |
MI 2.2 |
Hauptvortrag:
Structural Characterization of nc-Si / SiOx based quantum superstructures for the solar cell application by aberration-corrected high resolution electron microscopy — •Maryam Beig Mohamadi, Birger Berghoff, and Joachim Mayer
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12:45 |
MI 2.3 |
Aktuelle Ergebnisse mit den HRTEM JEOL JEM-ARM 200F — •Jürgen Heindl
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13:00 |
MI 2.4 |
Investigation of innovative capacitors for energy storage based on 0-3 composites — •Jens Glenneberg, Gerald Wagner, Alexandra Buchsteiner, Mandy Zenkner, Thomas Großmann, Claudia Ehrhardt, Stefan G. Ebbinghaus, Martin Diestelhorst, Sebastian Lemm, Wolfram Münchgesang, Horst Beige, and Hartmut S. Leipner
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