Regensburg 2013 – wissenschaftliches Programm

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MI: Fachverband Mikrosonden

MI 6: X-ray Imaging, Holography and Tomography

MI 6.4: Vortrag

Mittwoch, 13. März 2013, 10:15–10:30, H5

3D validation of X-Ray Diffraction Contrast Tomography reconstructions of polycristalline materials by means of serial sectioning and EBSD analysis — •Barbara Lödermann¹, Andreas Graff², Andreas Trenkle¹, Melanie Syha¹, Mathias Reichardt¹, Michael Selzer¹, Daniel Weygand¹, Wolfgang Ludwig³, and Peter Gumbsch¹ — ¹KIT, IAM ZBS, Karlsruhe, Germany — ²Fraunhofer IWM, Halle, Germany — ³ESRF, Grenoble, France

A cylindric strontium titanate specimen which has been subjected to repetitive X-Ray Diffraction Contrast Tomography (DCT) scans is investigated by means of Electron Backscatter Diffraction Analysis (EBSD). Therefor, 8 cross-sections of the sample in 3-10 microns distance have been prepared manually. Corresponding cross-sections of the reconstructed microstructures as obtained by DCT are identified and compared to EBSD characterizations. Moreover, a 3D reconstruction generated by a Voronoi segmentation algorithm of the destructive characterization is presented and aligned to the structure as obtained by DCT alongside with a direct comparison of the crystallographic orientation obtained for the individual crystallites. Focussing on the position and curvature of the grain boundaries, the results are discussed in the context of the spatial resolution and optimization potential of the diffraction data.