Regensburg 2013 – scientific programme

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MI: Fachverband Mikrosonden

MI 6: X-ray Imaging, Holography and Tomography

MI 6.5: Talk

Wednesday, March 13, 2013, 10:30–10:45, H5

The Potential of Scatter-Free Pinholes for X-ray Analytical Equipment — •Andreas Kleine, Frank Hertlein, and Carsten Michaelsen — Incoatec GmbH, Max-Planck-Str. 2, 21502 Geesthacht, Germany

Parasitic scattering caused by apertures is a well-known problem in X-ray analytics, which forces users and manufactures to adapt their experimental setup to this unwanted phenomenon. Increased measurement times due to lower photon fluxes, a lower resolution caused by an enlarged beam stop, a larger beam defining pinhole-to-sample distance due to the integration of an antiscatter guard and generally a lower signal-to-noise ratio leads to a loss in data quality.

In this presentation we will show how the lately developed scatter-free pinholes overcome the aforementioned problems. We will show measurements performed at home-lab small angle X-ray scattering (SAXS) systems and at synchrotron beamlines which compare conventional pinholes, scatterless Germanium slit systems and scatter-free SCATEX pinholes.

We will further present the latest developments regarding the novel liquid metal jet X-ray source, a technology which has already shown intensities superior to the best rotating anode. The latest results of this new source technology in combination with scatter-free pinholes will be presented.